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Singh, R.R.; Saini, N.K.; Goyal, S.P. 2017. Scanning electron microscopy: a potential forensic tool to identify a piece of rhinoceros horn. International Journal of Scientific Reports 3 (2): 33-38.

Singh, R.R.; Goyal, S.P.; Mukherjee, P.K.; Saini, N.K.; Rathi, M.S. 2017. Application of X-Ray diffraction to characterize ivory, antler and rhino horn: implications for wildlife forensics. Forensic Science International 136 (Suppl. 1): 376-377.